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Co-authors
(65)
Yiming Li
56
Chih-Hong Hwang
11
Chun-Yen Yiu
9
Ming-Hung Han
8
Kuo-Fu Lee
7
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Authors
Hui-Wen Cheng
Hui-Wen Cheng,National Chiao Tung University, Taiwan,Electrical & Electronic Engineering,Nanotechnology,Physics
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Hui-Wen Cheng
National Chiao Tung University, Taiwan
Publications:
61
|
Citations:
39
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
,
Physics
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Collaborated with
65 co-authors
from 1997 to 2012
|
Cited by
68 authors
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Publications
(61)
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Random Work-Function-Induced Threshold Voltage Fluctuation in Metal-Gate MOS Devices by Monte Carlo Simulation
Yiming Li
,
Hui-Wen Cheng
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 25, no. 2, pp. 266-271, 2012
Toward full fluctuation analysis of small FETs
Yiming Li
,
Hui-Wen Cheng
Conference:
International Meeting for Future of Electron Devices - IMFEDK
, 2012
Investigation of Raman enhancement in hydrothermally roughened SERS-active substrates
(
Citations: 1
)
Hui-Wen Cheng
,
Yiming Li
,
Jung-Yen Yang
Journal:
Computer Physics Communications
, vol. 182, no. 1, pp. 260-262, 2011
Quantum hydrodynamic simulation of discrete-dopant fluctuated physical quantities in nanoscale FinFET
(
Citations: 1
)
Yiming Li
,
Hui-Wen Cheng
,
Ming-Hung Han
Journal:
Computer Physics Communications
, vol. 182, no. 1, pp. 96-98, 2011
3D finite element simulation of morphological effect on reflectance of Si3N4 sub-wavelength structures for silicon solar cells
Yiming Li
,
Ming-Yi Lee
,
Hui-Wen Cheng
,
Zheng-Liang Lu
,
Kartika Chandra Sahoo
,
Edward Yi Chang
Conference:
IEEE International Nanoelectronics Conference - INEC
, pp. 1-2, 2011
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Citations
(39 times by 30 publications)
Effect of Substituents and Dopants on the Structure–Property Relationship of Poly(Aniline)—A Comparative Study
R. Anbarasan
,
V. Sangeeth
,
M. Saravanan
,
R. Rajkumar
,
M. Anandhaalaguraja
,
V. Dhanalakshmi
Journal:
Journal of Macromolecular Science, Part B
, vol. 50, no. 4, pp. 704-719, 2011
Statistical Threshold-Voltage Variability in Scaled Decananometer Bulk HKMG MOSFETs: A Full-Scale 3-D Simulation Scaling Study
Xingsheng Wang
,
Andrew R. Brown
,
Niza Idris
,
Stanislav Markov
,
Gareth Roy
,
Asen Asenov
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 8, pp. 2293-2301, 2011
Nanosized metal grains induced electrical characteristic fluctuation in 16 nm bulk and SOI FinFET devices with TiN/HfO2 gate stack
Hui-Wen Cheng
,
Yiming Li
,
Chun-Yen Yiu
,
Hsin-Wen Su
Conference:
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
, pp. 287-290, 2011
Large-scale statistical simulation of characteristic variation in 16-nm-gate Bulk FinFET devices due to work function fluctuation
Chun-Yen Yiu
,
Hui-Wen Cheng
,
Hsin-Wen Su
,
Yiming Li
Conference:
IEEE International Nanoelectronics Conference - INEC
, pp. 1-2, 2011
A Physics-Based Three-Dimensional Analytical Model for RDF-Induced Threshold Voltage Variations
Georgios Panagopoulos
,
Kaushik Roy
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 2, pp. 392-403, 2011
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